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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 8 — Apr. 15, 2008
  • pp: 848–850

Amplitude- and phase-resolved optical near fields of split-ring-resonator-based metamaterials

T. Zentgraf, J. Dorfmüller, C. Rockstuhl, C. Etrich, R. Vogelgesang, K. Kern, T. Pertsch, F. Lederer, and H. Giessen  »View Author Affiliations

Optics Letters, Vol. 33, Issue 8, pp. 848-850 (2008)

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We investigate the local optical response of split-ring resonator-(SRR)-based metamaterials with an apertureless scanning near-field optical microscope. By mapping the near fields of suitably resonant micrometer-sized SRRs in the near-infrared spectral region with an uncoated silicon tip, we obtain a spatial resolution of better than λ 50 . The experimental results confirm numerical predictions of the near-field excitations of SRRs. Combining experimental near-field optical studies with near- and far-field optical simulations provides a detailed understanding of resonance mechanisms in subwavelength structures and will facilitate an efficient approach to improved designs.

© 2008 Optical Society of America

OCIS Codes
(160.3900) Materials : Metals
(160.4760) Materials : Optical properties
(160.3918) Materials : Metamaterials
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:

Original Manuscript: January 4, 2008
Revised Manuscript: March 3, 2008
Manuscript Accepted: March 9, 2008
Published: April 14, 2008

T. Zentgraf, J. Dorfmüller, C. Rockstuhl, C. Etrich, R. Vogelgesang, K. Kern, T. Pertsch, F. Lederer, and H. Giessen, "Amplitude- and phase-resolved optical near fields of split-ring-resonator-based metamaterials," Opt. Lett. 33, 848-850 (2008)

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  1. S. Linden, C. Enkrich, M. Wegener, J. Zhou, T. Koschny, and C. M. Soukoulis, Science 306, 1351 (2004). [CrossRef] [PubMed]
  2. V. M. Shalaev, W. Cai, U. K. Chettiar, H.-K. Yuan, A. K. Sarychev, V. P. Drachev, and A. V. Kildishev, Opt. Lett. 30, 3356 (2005). [CrossRef]
  3. S. Zhang, W. Fan, N. C. Panoiu, K. J. Malloy, R. M. Osgood, and S. R. J. Brueck, Phys. Rev. Lett. 95, 137404 (2005). [CrossRef] [PubMed]
  4. J. P. Pendry, A. J. Holden, D. J. Robbins, and W. J. Stewart, IEEE Trans. Microwave Theory Tech. 47, 2075 (1999). [CrossRef]
  5. T. J. Yen, W. J. Padilla, N. Fang, D. C. Vier, D. R. Smith, J. B. Pendry, D. N. Basov, and X. Zhang, Science 303, 1494 (2004). [CrossRef] [PubMed]
  6. N. P. Johnson, A. Z. Khokhar, H. M. Chong, R. M. De La Rue, T. J. Antosiewicz, and S. McMeekin, Opto-Electron. Rev. 14, 187 (2006). [CrossRef]
  7. C. Rockstuhl, T. Zentgraf, H. Guo, N. Liu, C. Etrich, I. Loa, K. Syassen, J. Kuhl, F. Lederer, and H. Giessen, Appl. Phys. B 84, 219 (2006). [CrossRef]
  8. H. Guo, N. Liu, L. Fu, H. Schweizer, S. Kaiser, and H. Giessen, Phys. Status Solidi B 244, 1256 (2007). [CrossRef]
  9. Additional parameters for the small structures (large structures) are the linewidth of 150nm(360nm) and the period of 0.7μm(1.62μm), which is identical in the x- and y-directions.
  10. The number directly indicates the number of nodal lines in the planar field pattern cut of the z component of the electric field and is consistent with the denotation in .
  11. A. Bek, R. Vogelgesang, and K. Kern, Rev. Sci. Instrum. 77, 043703 (2006). [CrossRef]
  12. C. Rockstuhl, F. Lederer, C. Etrich, T. Zentgraf, J. Kuhl, and H. Giessen, Opt. Express 14, 8827 (2006). [CrossRef] [PubMed]
  13. M. Abashin, U. Levy, K. Ikeda, and Y. Fainman, Opt. Lett. 32, 2602 (2007). [CrossRef] [PubMed]

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