OSA's Digital Library

Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 1 — Jan. 1, 2009
  • pp: 112–114

Fabrication of micromodel grid for various moiré methods by femtosecond laser exposure

Satoshi Kishimoto, Yoshihisa Tanaka, Toru Tomimatsu, Yutaka Kagawa, and Kotobu Nagai  »View Author Affiliations

Optics Letters, Vol. 34, Issue 1, pp. 112-114 (2009)

View Full Text Article

Enhanced HTML    Acrobat PDF (338 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The femtosecond laser exposure system was used to fabricate model grids for the charge-coupled device (CCD) moiré method, scanning laser moiré method, and electron moiré method for microstrain deformation measurements. The femtosecond laser exposure produces mesoscopic variation patterns on the surface. These variation patterns make the grid in the scanning laser microscope and CCD images darker and make the grid in the scanning electron microscope image brighter. The CCD moiré fringe, scanning laser moiré fringe, and electron moiré fringe consisting of bright and dark lines were generated. As a demonstration, microstrain distribution of the three-point bending tested specimen was measured.

© 2008 Optical Society of America

OCIS Codes
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(140.3295) Lasers and laser optics : Laser beam characterization

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 26, 2008
Revised Manuscript: November 21, 2008
Manuscript Accepted: November 22, 2008
Published: December 31, 2008

Satoshi Kishimoto, Yoshihisa Tanaka, Toru Tomimatsu, Yutaka Kagawa, and Kotobu Nagai, "Fabrication of micromodel grid for various moiré methods by femtosecond laser exposure," Opt. Lett. 34, 112-114 (2009)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. R. Weller and B. M. Shepard, Proc. Soc. Exp. Stress Anal. 6, 35 (1948).
  2. S. A. Morse, J. Durelli, and C. A. Sciammarella, J. Engrg. Mech. Div. 86, 105 (1960).
  3. C. A. Sciammarela and A. J. Durelli, J. Engrg. Mech. Div. 87, 55 (1961).
  4. A. J. Durelli and V. J. Parks, Moiré Analysis of Strain (Prentice Hall, 1970).
  5. S. Theocaris, Moiré Fringe in Strain Analysis (Pergamon, 1969).
  6. D. Post, B. Han, and P. Ifju, High Sensitivity Moiré (Springer, 1994).
  7. F. P. Chiang, Moiré Method of Strain Analysis Manual on Experimental Stress Analysis, 5th ed., J.F.Doyle and J.W.Phillips, eds. (Society for Experimental Mechanics, 1982), p. 107.
  8. D. Post, Exp. Mech. 28, 329 (1988). [CrossRef]
  9. S. Kishimoto, M. Egashira, N. Shinya, and R. A. Carolan, in Proceedings of the 6th International Conference on Mechanical Behavior of Materials (Pergamon, 1991), p. 661.
  10. S. Kishimoto, M. Egashira, and N. Shinya, Opt. Eng. (Bellingham) 32, 522 (1993). [CrossRef]
  11. D. T. Read and J. W. Dally, Trans. ASME, J. Appl. Mech. 61, 402 (1994). [CrossRef]
  12. J. W. Dally and D. T. Read, Exp. Mech. 33, 270 (1993). [CrossRef]
  13. D. T. Read, J. W. Dally, and M. Szanto, Exp. Mech. 33, 110 (1993). [CrossRef]
  14. Y. Morimoto, I. M. Yang, and C. G. Gu, Opt. Lasers Eng. 24, 3 (1996). [CrossRef]
  15. A. Asundi and K. H. Yung, Exp. Mech. 31, 236 (1991). [CrossRef]
  16. J. Kato, I. Yamaguchi, T. Nakamura, and S. Kuwashima, Appl. Opt. 36, 8403 (1997). [CrossRef]
  17. K. H. Womack, Opt. Eng. (Bellingham) 23, 391 (1984).
  18. H. Xie, Q. Wang, S. Kishimoto, and F. Dai, J. Appl. Phys. 101, 103511 (2007). [CrossRef]
  19. L. Y. Nakata, T. Okada, and M. Maeda, Appl. Phys. A 79, 1481 (2004).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3
Fig. 4

« Previous Article

OSA is a member of CrossRef.

CrossCheck Deposited