Spectral interferometry and reflectometry used for characterization of a multilayer mirror
Optics Letters, Vol. 34, Issue 10, pp. 1564-1566 (2009)
http://dx.doi.org/10.1364/OL.34.001564
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Abstract
A white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measurement of the reflectance spectrum of the mirror in the same interferometer.
© 2009 Optical Society of America
OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.4040) Optical devices : Mirrors
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: March 4, 2009
Manuscript Accepted: April 14, 2009
Published: May 12, 2009
Citation
Petr Hlubina, Jiří Luňáček, and Dalibor Ciprian, "Spectral interferometry and reflectometry used for characterization of a multilayer mirror," Opt. Lett. 34, 1564-1566 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-10-1564
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