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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 12 — Jun. 15, 2009
  • pp: 1798–1800

Polarization-dependent loss compensation on silicon-wire waveguide tap by complex refractive index of metals

Shih-Hsiang Hsu  »View Author Affiliations


Optics Letters, Vol. 34, Issue 12, pp. 1798-1800 (2009)
http://dx.doi.org/10.1364/OL.34.001798


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Abstract

A photodetector can be applied onto a silicon-wire waveguide tap to monitor light signals on waveguides. To meet the complexity of optical integrated circuits, the proposed photodetector would be positioned onto a wafer base instead of being employed and terminated at the edge end of an optical component. Because the silicon-wire-based optical directional coupler shows an undesirably high level of polarization-dependent loss on the tap port compared with the primary port, the complex refractive index of the reflective metal layer was proposed integrated into the direction-changing tap region, made using a 54.7° angle from anisotropic silicon wet etching. This structure compensates for the polarization dependent loss of the tapping signal power for the primary port monitoring.

© 2009 Optical Society of America

OCIS Codes
(230.0230) Optical devices : Optical devices
(230.7370) Optical devices : Waveguides

ToC Category:
Optical Devices

History
Original Manuscript: March 11, 2009
Revised Manuscript: May 5, 2009
Manuscript Accepted: May 6, 2009
Published: June 4, 2009

Citation
Shih-Hsiang Hsu, "Polarization-dependent loss compensation on silicon-wire waveguide tap by complex refractive index of metals," Opt. Lett. 34, 1798-1800 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-12-1798

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