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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 12 — Jun. 15, 2009
  • pp: 1906–1908

Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light

P. Albella, J. M. Saiz, J. M. Sanz, F. González, and F. Moreno  »View Author Affiliations


Optics Letters, Vol. 34, Issue 12, pp. 1906-1908 (2009)
http://dx.doi.org/10.1364/OL.34.001906


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Abstract

We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.

© 2009 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(240.6680) Optics at surfaces : Surface plasmons
(290.5850) Scattering : Scattering, particles
(290.5855) Scattering : Scattering, polarization

ToC Category:
Scattering

History
Original Manuscript: January 7, 2009
Revised Manuscript: May 13, 2009
Manuscript Accepted: May 15, 2009
Published: June 12, 2009

Citation
P. Albella, J. M. Saiz, J. M. Sanz, F. González, and F. Moreno, "Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light," Opt. Lett. 34, 1906-1908 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-12-1906

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