We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.
© 2009 Optical Society of America
Original Manuscript: January 7, 2009
Revised Manuscript: May 13, 2009
Manuscript Accepted: May 15, 2009
Published: June 12, 2009
P. Albella, J. M. Saiz, J. M. Sanz, F. González, and F. Moreno, "Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light," Opt. Lett. 34, 1906-1908 (2009)