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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 13 — Jul. 1, 2009
  • pp: 1927–1929

Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra

Arunkumar Jagannathan, Andrew J. Gatesman, and Robert H. Giles  »View Author Affiliations

Optics Letters, Vol. 34, Issue 13, pp. 1927-1929 (2009)

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This paper reports on the effect of random Gaussian roughness with rms roughness values of 5 20 μ m on the terahertz reflection spectra of metallic aluminum surfaces using Fourier transform IR spectroscopy. By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. In addition, we demonstrate that this method can be used to clearly resolve rough surfaces that differ in rms roughness by approximately 1 μ m .

© 2009 Optical Society of America

OCIS Codes
(290.5880) Scattering : Scattering, rough surfaces
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:

Original Manuscript: February 4, 2009
Revised Manuscript: April 15, 2009
Manuscript Accepted: May 13, 2009
Published: June 19, 2009

Arunkumar Jagannathan, Andrew J. Gatesman, and Robert H. Giles, "Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra," Opt. Lett. 34, 1927-1929 (2009)

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