OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 13 — Jul. 1, 2009
  • pp: 1927–1929

Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra

Arunkumar Jagannathan, Andrew J. Gatesman, and Robert H. Giles  »View Author Affiliations


Optics Letters, Vol. 34, Issue 13, pp. 1927-1929 (2009)
http://dx.doi.org/10.1364/OL.34.001927


View Full Text Article

Enhanced HTML    Acrobat PDF (265 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

This paper reports on the effect of random Gaussian roughness with rms roughness values of 5 20 μ m on the terahertz reflection spectra of metallic aluminum surfaces using Fourier transform IR spectroscopy. By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. In addition, we demonstrate that this method can be used to clearly resolve rough surfaces that differ in rms roughness by approximately 1 μ m .

© 2009 Optical Society of America

OCIS Codes
(290.5880) Scattering : Scattering, rough surfaces
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Scattering

History
Original Manuscript: February 4, 2009
Revised Manuscript: April 15, 2009
Manuscript Accepted: May 13, 2009
Published: June 19, 2009

Citation
Arunkumar Jagannathan, Andrew J. Gatesman, and Robert H. Giles, "Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra," Opt. Lett. 34, 1927-1929 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-13-1927


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Artech House, 1987), pp. 80-98.
  2. S. K Nayar, K. Ikeuchi, and T. Kanade, IEEE Transactions on Pattern Analysis and Machine Intelligence (IEEE1991), pp. 611-634. [CrossRef]
  3. R. Piesiewicz, C. Jansen, D. Mittleman, T. Kleine-Ostmann, M. Koch, and T. Kürner, IEEE Transactions on Antennas and Propagation (IEEE2007), pp. 3002-3009. [CrossRef]
  4. Y. Dikmelik and J. B. Spicer, Opt. Lett. 31, 24, 3653 (2006). [CrossRef] [PubMed]
  5. Z. Zhou, A. Chen, J. Zhang, L. M. Zurk, B. Orlowski, E. Thorsos, D. Winebrenner, and L. R. Dalton, Proc. SPIE 6772, 67720T1 (2007).
  6. C. A. Depew and R. D. Weir, Appl. Opt. 10, 969 (1970). [CrossRef]
  7. M. Ortolani, J. S. Lee, U. Schade, and H.-W. Hübers, Appl. Phys. Lett. 93, 081906 (2008). [CrossRef]
  8. R. F. Anastasi and E. I. Madaras, in Proceedings of the 4th International Workshop on Ultrasonic and Advanced Methods for Nondestructive Testing and Material Characterization (2006). [PubMed]
  9. A. J. Gatesman, R. H. Giles, and J. Waldman, J. Opt. Soc. Am. B 12, 212 (1995). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited