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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 15 — Aug. 1, 2009
  • pp: 2246–2248

Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam

Tsu-Shin Chan, Mykhaylo M. Dvoynenko, Chih-Yi Liu, Juen-Kai Wang, and Yuh-Lin Wang  »View Author Affiliations

Optics Letters, Vol. 34, Issue 15, pp. 2246-2248 (2009)

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Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm . The G mode located at 1579 cm 1 does not exhibit a measurable tip enhancement, while the D mode at 1364 cm 1 is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.

© 2009 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(290.5860) Scattering : Scattering, Raman
(300.6330) Spectroscopy : Spectroscopy, inelastic scattering including Raman
(180.4243) Microscopy : Near-field microscopy
(180.5655) Microscopy : Raman microscopy
(240.6695) Optics at surfaces : Surface-enhanced Raman scattering

ToC Category:

Original Manuscript: March 26, 2009
Revised Manuscript: June 19, 2009
Manuscript Accepted: June 21, 2009
Published: July 17, 2009

Tsu-Shin Chan, Mykhaylo M. Dvoynenko, Chih-Yi Liu, Juen-Kai Wang, and Yuh-Lin Wang, "Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam," Opt. Lett. 34, 2246-2248 (2009)

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