Terahertz characterization of semiconductor alloy AlInN: negative imaginary conductivity and its meaning
Optics Letters, Vol. 34, Issue 16, pp. 2507-2509 (2009)
http://dx.doi.org/10.1364/OL.34.002507
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Abstract
Through terahertz time-domain spectroscopy, negative imaginary conductivity is observed in In-rich AlInN film grown by metal–organic chemical-vapor deposition for frequencies from
© 2009 Optical Society of America
OCIS Codes
(300.6470) Spectroscopy : Spectroscopy, semiconductors
(310.0310) Thin films : Thin films
(300.6495) Spectroscopy : Spectroscopy, teraherz
ToC Category:
Spectroscopy
History
Original Manuscript: June 2, 2009
Revised Manuscript: July 14, 2009
Manuscript Accepted: July 26, 2009
Published: August 13, 2009
Citation
Ting-Ting Kang, Masatomo Yamamoto, Mikiyasu Tanaka, Akihiro Hashimoto, Akio Yamamoto, Ryota Sudo, Akifumi Noda, D. W. Liu, and Kohji Yamamoto, "Terahertz characterization of semiconductor alloy AlInN: negative imaginary conductivity and its meaning," Opt. Lett. 34, 2507-2509 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-16-2507
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