Improved high-order ambiguity-function method for the estimation of phase from interferometric fringes
Optics Letters, Vol. 34, Issue 17, pp. 2575-2577 (2009)
http://dx.doi.org/10.1364/OL.34.002575
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Abstract
Interferometers often encode the information on the measurand in the phase of a fringe pattern, which is usually recorded by an imaging device. Accuracy of measurements carried out by interferometric techniques is thus strongly dependent on the accuracy with which the underlying phase distribution of these fringe patterns is estimated. Fringe analysis methods, which have been developed to accomplish this task, are in general characterized by their performance in terms of both accuracy of phase estimation and associated computational complexity. We propose an improved high-order ambiguity-function-based fringe-analysis method that is demonstrated to provide an accurate and direct estimation of the unwrapped phase distribution in a highly computationally efficient manner. Presented simulation and experimental results in digital holographic interferometry depict the potential utility of the proposed method.
© 2009 Optical Society of America
OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(090.1995) Holography : Digital holography
ToC Category:
Holography
History
Original Manuscript: July 6, 2009
Manuscript Accepted: July 25, 2009
Published: August 19, 2009
Citation
Sai Siva Gorthi and Pramod Rastogi, "Improved high-order ambiguity-function method for the estimation of phase from interferometric fringes," Opt. Lett. 34, 2575-2577 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-17-2575
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