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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 19 — Oct. 1, 2009
  • pp: 2921–2923

Nanoporous silicon multilayers for terahertz filtering

Shu-Zee A. Lo and Thomas E. Murphy  »View Author Affiliations


Optics Letters, Vol. 34, Issue 19, pp. 2921-2923 (2009)
http://dx.doi.org/10.1364/OL.34.002921


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Abstract

We describe the fabrication, simulation, and measurement of a terahertz (THz) filter composed of nanoporous silicon multilayers. Using electrochemical etching, we fabricated a structure composed of alternating high- and low-index layers that achieves 93% power reflectivity at the target wavelength of 1.17 THz, with a stopband of 0.26 THz. The measured reflection and transmission spectra of the multilayer filter show excellent agreement with calculations based on the refractive indices determined separately from single-layer measurements. This technique could provide a convenient, flexible, and economical way to produce THz filters, which are essential in a variety of future applications.

© 2009 Optical Society of America

OCIS Codes
(220.0220) Optical design and fabrication : Optical design and fabrication
(230.1480) Optical devices : Bragg reflectors
(220.4241) Optical design and fabrication : Nanostructure fabrication
(300.6495) Spectroscopy : Spectroscopy, teraherz
(230.7408) Optical devices : Wavelength filtering devices

ToC Category:
Spectroscopy

History
Original Manuscript: July 21, 2009
Revised Manuscript: August 18, 2009
Manuscript Accepted: August 20, 2009
Published: September 18, 2009

Citation
Shu-Zee A. Lo and Thomas E. Murphy, "Nanoporous silicon multilayers for terahertz filtering," Opt. Lett. 34, 2921-2923 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-19-2921


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References

  1. R. Schiwon, G. Schwaab, E. Brundermann, and M. Havenith, Appl. Phys. Lett. 83, 4119 (2003). [CrossRef]
  2. N. Krumbholz, K. Gerlach, F. Rutz, and M. Koch, Appl. Phys. Lett. 88, 202905 (2006). [CrossRef]
  3. H. Němec, P. Kužel, F. Garet, and L. Duvillaret, Appl. Opt. 43, 1965 (2004). [CrossRef] [PubMed]
  4. T. W. Du Bosq, A. V. Muravjov, R. E. Peale, and C. J. Fredricksen, Appl. Opt. 44, 7191 (2005). [CrossRef] [PubMed]
  5. W. Withayachumnankul, B. M. Fischer, and D. Abbott, Opt. Commun. 281, 2374 (2008). [CrossRef]
  6. H. Němec, P. Kužel, L. Duvillaret, A. Pashkin, M. Dressel, and M. T. Sebastian, Opt. Lett. 30, 549 (2005). [CrossRef] [PubMed]
  7. N. Matsumoto, T. Nakagawa, K. Kageyama, N. Wada, and Y. Sakabe, Jpn. J. Appl. Phys. Part 1 45, 7499 (2006). [CrossRef]
  8. F. Rutz, M. Koch, L. Micele, and G. de Portu, Appl. Opt. 45, 8070 (2006). [CrossRef] [PubMed]
  9. J. Shao and J. A. Dobrowolski, Appl. Opt. 32, 2361 (1993). [CrossRef] [PubMed]
  10. D. Turchinovich, A. Kammoun, P. Knobloch, T. Dobbertin, and M. Koch, Appl. Phys. A 74, 291 (2002). [CrossRef]
  11. S. Wietzke, C. Jansen, F. Rutz, D. Mittleman, and M. Koch, Polym. Test. 26, 614 (2007). [CrossRef]
  12. J. Lott, C. Xia, L. Kosnosky, C. Weder, and J. Shan, Adv. Mater. 20, 3649 (2008). [CrossRef]
  13. J. S. Seeley, R. Hunneman, and A. Whatley, Appl. Opt. 20, 31 (1981). [CrossRef] [PubMed]
  14. I. Hosako, Appl. Opt. 44, 3769 (2005). [CrossRef] [PubMed]
  15. R. Wilk, N. Vieweg, O. Kopschinski, and M. Koch, Opt. Express 17, 7377 (2009). [CrossRef] [PubMed]
  16. S. Labbé-Lavigne, S. Barret, F. Garet, L. Duvillaret, and J.-L. Coutaz, J. Appl. Phys. 83, 6007 (1998). [CrossRef]
  17. S. Ramani, A. Cheville, E. Garcia, and V. Agarwal, Phys. Status Solidi C 4, 2111 (2007). [CrossRef]
  18. S.-Z. A. Lo, A. M. Rossi, and T. E. Murphy, Phys. Status Solidi A 206, 1273 (2009). [CrossRef]
  19. M. G. Berger, C. Dieker, M. Thönissen, L. Vescan, H. Lüth, H. Münder, W. Theiss, M. Wernke, and P. Grosse, J. Phys. D 27, 1333 (1994). [CrossRef]
  20. J. N. Heyman, P. Neocleous, D. Hebert, P. A. Crowell, T. Müller, and K. Unterrainer, Phys. Rev. B 64, 085202 (2001). [CrossRef]
  21. A. Nahata, A. S. Weling, and T. F. Heinz, Appl. Phys. Lett. 69, 2321 (1996). [CrossRef]
  22. J. Dai, J. Zhang, W. Zhang, and D. Grischkowsky, J. Opt. Soc. Am. B 21, 1379 (2004). [CrossRef]
  23. L. Duvillaret, F. Garet, and J.-L. Coutaz, IEEE J. Sel. Top. Quantum Electron. 2, 739 (1996). [CrossRef]
  24. I. A. Ibraheem, N. Krumbholz, D. Mittleman, and M. Koch, IEEE Microw. Wirel. Compon. Lett. 18, 67 (2008). [CrossRef]

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