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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 34, Iss. 19 — Oct. 1, 2009
  • pp: 2930–2932

X-ray Schwarzschild objective for the carbon window ( λ 4.5   nm )

Igor Artyukov, Yegor Bugayev, Olexander Devizenko, Eric Gullikson, Valeriy Kondratenko, and Alexander Vinogradov  »View Author Affiliations


Optics Letters, Vol. 34, Issue 19, pp. 2930-2932 (2009)
http://dx.doi.org/10.1364/OL.34.002930


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Abstract

We deal with the recent progress in the fabrication of the graded Co/C multilayer mirrors to be used in a 21× Schwarzschild objective (SO) operating at the wavelengths near 4.5 nm (“carbon window” region). The peak reflectivity of flat Co/C mirrors was measured to be 14.8% (wavelength of 4.48 nm, incidence angle of 5°). The reflectivity curves of the spherical mirrors achieved 3%–6%, with the spectral matching accuracy being Δ d 0.008   nm ( Δ d / d 0.3 % ) . As a result the SO demonstrates a full working aperture ( N A 0.2 ) operation with the total throughput of 0.25%.

© 2009 Optical Society of America

OCIS Codes
(180.7460) Microscopy : X-ray microscopy
(310.1860) Thin films : Deposition and fabrication
(340.7470) X-ray optics : X-ray mirrors

ToC Category:
X-ray Optics

History
Original Manuscript: June 17, 2009
Revised Manuscript: August 19, 2009
Manuscript Accepted: August 20, 2009
Published: September 22, 2009

Citation
Igor Artyukov, Yegor Bugayev, Olexander Devizenko, Eric Gullikson, Valeriy Kondratenko, and Alexander Vinogradov, "X-ray Schwarzschild objective for the carbon window (λ~4.5 nm)," Opt. Lett. 34, 2930-2932 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-19-2930


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References

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