Critical sensitivity effect in an interferometer sensor
Optics Letters, Vol. 34, Issue 19, pp. 3023-3025 (2009)
http://dx.doi.org/10.1364/OL.34.003023
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Abstract
We report the observation of anomalous behavior in the spectral sensitivity response in a specially designed waveguided interferometer sensor. Approaching a definite critical point, the sensitivity increases nonlinearly. Furthermore, at the critical wavelength a new effect of splitting or bifurcation of a minimum dip is observed. The value of the splitting is suggested as an advantageous measure for sensing.
© 2009 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(130.6010) Integrated optics : Sensors
ToC Category:
Integrated Optics
History
Original Manuscript: May 14, 2009
Revised Manuscript: July 5, 2009
Manuscript Accepted: August 29, 2009
Published: September 30, 2009
Citation
Ronen Levy, Shlomo Ruschin, and Damian Goldring, "Critical sensitivity effect in an interferometer sensor," Opt. Lett. 34, 3023-3025 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-19-3023
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