Focusing properties of hard x-ray photon sieves: three-parameter apodization window and waveguide effect
Optics Letters, Vol. 34, Issue 19, pp. 3038-3040 (2009)
http://dx.doi.org/10.1364/OL.34.003038
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Abstract
In this Letter, a three-parameter modified Kaiser apodization window is used to modulate the pinhole density on each ring of hard x-ray photon sieves, analyzing the guided-wave propagation inside the photon sieves’ nanostructure. Theoretical analysis reveals that the waveguide effect can suppress the emergence of the high-order diffraction effect; the additional parameter of the modified Kaiser window function gives rise to new degrees of freedom for manipulating the FWHM and signal-to-noise ratio. Metal nanostructure thickness has no influence on the FWHM. Hard x-ray photon sieves with 90° phase shift (not 180° phase shift) can provide the best signal-to-noise ratio, which relaxes the nanofabrication constraints somewhat. Our work provides a robust way to design hard x-ray photon sieves.
© 2009 Optical Society of America
OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(230.3990) Optical devices : Micro-optical devices
(340.7430) X-ray optics : X-ray coded apertures
ToC Category:
X-ray Optics
History
Original Manuscript: July 8, 2009
Revised Manuscript: August 14, 2009
Manuscript Accepted: August 24, 2009
Published: September 30, 2009
Citation
Changqing Xie, Xiaoli Zhu, and Jia Jia, "Focusing properties of hard x-ray photon sieves: three-parameter apodization window and waveguide effect," Opt. Lett. 34, 3038-3040 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-19-3038
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