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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 21 — Nov. 1, 2009
  • pp: 3415–3417

Two-beam SPIDER for dual-pulse single-shot characterization

Doug French, Christophe Dorrer, and Igor Jovanovic  »View Author Affiliations

Optics Letters, Vol. 34, Issue 21, pp. 3415-3417 (2009)

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We describe an innovative design of the spectral-phase-interferometry-for-direct-electric-field-reconstruction (SPIDER) technique applicable to the simultaneous measurement of the electric field of two ultrashort pulses, e.g., a reference and probe pulse. We demonstrate the utility of the device by measuring material dispersion in a single shot by subtracting the reconstructed phase of a dispersed pulse and a reference pulse and by quantifying phase differences arising from nonlinear effects. Our two-beam technique is particularly suitable for use in experiments performed on high-energy, ultrafast laser systems operating in a single-shot mode with significant pulse-to-pulse variations.

© 2009 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.0320) Ultrafast optics : Ultrafast optics
(320.5550) Ultrafast optics : Pulses
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

Original Manuscript: July 23, 2009
Manuscript Accepted: September 16, 2009
Published: October 29, 2009

Doug French, Christophe Dorrer, and Igor Jovanovic, "Two-beam SPIDER for dual-pulse single-shot characterization," Opt. Lett. 34, 3415-3417 (2009)

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