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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 22 — Nov. 15, 2009
  • pp: 3583–3585

Automatic deconvolution of 4Pi-microscopy data with arbitrary phase

Giuseppe Vicidomini, Stefan W. Hell, and Andreas Schönle  »View Author Affiliations

Optics Letters, Vol. 34, Issue 22, pp. 3583-3585 (2009)

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We propose a maximum a posteriori-based method that solves an important practical problem in the deconvolution of 4Pi images by simultaneously delivering an estimate of both the object and the unknown phase. The method was tested in simulations and on data from both test samples and biological specimen. It generates object estimates that are free from interference artifacts and reliably recovers arbitrary relative phases. Based on vectorial focusing theory, our theoretical analysis allowed for a simple and efficient implementation of the algorithm. Taking several 4Pi images at different relative phases of the interfering beams is shown to improve the robustness of the approach.

© 2009 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.6900) Microscopy : Three-dimensional microscopy
(100.1455) Image processing : Blind deconvolution

ToC Category:

Original Manuscript: July 2, 2009
Revised Manuscript: October 6, 2009
Manuscript Accepted: October 9, 2009
Published: November 13, 2009

Virtual Issues
Vol. 4, Iss. 13 Virtual Journal for Biomedical Optics

Giuseppe Vicidomini, Stefan W. Hell, and Andreas Schönle, "Automatic deconvolution of 4Pi-microscopy data with arbitrary phase," Opt. Lett. 34, 3583-3585 (2009)

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