Submicrometer infrared surface imaging using a scanning-probe microscope and an optical parametric oscillator laser
Optics Letters, Vol. 34, Issue 4, pp. 431-433 (2009)
http://dx.doi.org/10.1364/OL.34.000431
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Abstract
Submicrometer IR surface imaging was performed with a resolution better than the diffraction limit. The apparatus was based on an IR optical parametric oscillator laser and a commercial atomic force microscope and used, as the detection mechanism, induced resonant oscillations in an atomic force microscopy (AFM) cantilever. For the first time to our knowledge this was achieved with top-down illumination and a benchtop IR source, thus extending the range of potential applications of this technique. IR absorption and AFM topography images of polystyrene beads were recorded simultaneously with an image resolution of
© 2009 Optical Society of America
OCIS Codes
(100.6640) Image processing : Superresolution
(110.3080) Imaging systems : Infrared imaging
ToC Category:
Imaging Systems
History
Original Manuscript: January 25, 2008
Revised Manuscript: January 25, 2008
Manuscript Accepted: January 27, 2008
Published: February 9, 2009
Virtual Issues
Vol. 4, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Graeme A. Hill, James H. Rice, Stephen R. Meech, Duncan Q. M. Craig, Paulina Kuo, Konstantin Vodopyanov, and Michael Reading, "Submicrometer infrared surface imaging using a scanning-probe microscope and an optical parametric oscillator laser," Opt. Lett. 34, 431-433 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-4-431
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