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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 6 — Mar. 15, 2009
  • pp: 839–841

Thickness dependence of surface plasmon polariton dispersion in transparent conducting oxide films at 1.55 μ m

F. Michelotti, L. Dominici, E. Descrovi, N. Danz, and F. Menchini  »View Author Affiliations

Optics Letters, Vol. 34, Issue 6, pp. 839-841 (2009)

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We experimentally demonstrate propagation of surface plasmon polaritons in the near-IR window λ ( 1.45 μ m , 1.59 μ m ) at the interface of indium-tin-oxide films with different thicknesses deposited on glass. Dispersion of such polaritons is strongly dependent on the film thickness, putting into evidence a regime in which polaritons at both films’s interfaces are coupled in surface supermodes. The experimental data are shown to be in good agreement with the analytical model for thin and absorbing conducting films. Measurements on aluminum-doped zinc oxide, characterized by a redshifted plasma resonance, do not show any surface plasmon polariton excitation in the same wavelength window.

© 2009 Optical Society of America

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(310.7005) Thin films : Transparent conductive coatings

ToC Category:
Thin Films

Original Manuscript: December 9, 2008
Revised Manuscript: January 30, 2009
Manuscript Accepted: February 4, 2009
Published: March 13, 2009

F. Michelotti, L. Dominici, E. Descrovi, N. Danz, and F. Menchini, "Thickness dependence of surface plasmon polariton dispersion in transparent conducting oxide films at 1.55 μm," Opt. Lett. 34, 839-841 (2009)

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