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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 7 — Apr. 1, 2009
  • pp: 1048–1050

Refractometric sensor utilizing a vertically coupled polymeric microdisk resonator incorporating a high refractive index overlay

Gun-Duk Kim, Geun-Sik Son, Hak-Soon Lee, Ki-Do Kim, and Sang-Shin Lee  »View Author Affiliations

Optics Letters, Vol. 34, Issue 7, pp. 1048-1050 (2009)

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A refractometric sensor resorting to a vertically coupled polymeric microdisk resonator was demonstrated, estimating the refractive index (RI) of an analyte by monitoring the resonant wavelength shift in its transfer characteristics. The disk resonator was especially overlaid with a high RI Ti O 2 film, thereby reinforcing the interaction of the evanescent field of its guided mode with the analyte. The sensitivity of the sensor was theoretically and experimentally confirmed to be enhanced by adjusting the overlay thickness. The fabricated sensor provided the maximum sensitivity of 294 nm /RIU (refractive index unit) with the 40 - nm -thick overlay, which is equivalent to an improvement of 150% compared with the case without the overlay.

© 2009 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(130.6010) Integrated optics : Sensors
(160.5470) Materials : Polymers
(230.5750) Optical devices : Resonators
(230.7370) Optical devices : Waveguides

ToC Category:
Integrated Optics

Original Manuscript: January 8, 2009
Revised Manuscript: February 25, 2009
Manuscript Accepted: February 27, 2009
Published: March 25, 2009

Virtual Issues
Vol. 4, Iss. 6 Virtual Journal for Biomedical Optics

Gun-Duk Kim, Geun-Sik Son, Hak-Soon Lee, Ki-Do Kim, and Sang-Shin Lee, "Refractometric sensor utilizing a vertically coupled polymeric microdisk resonator incorporating a high refractive index overlay," Opt. Lett. 34, 1048-1050 (2009)

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