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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 7 — Apr. 1, 2009
  • pp: 1054–1056

Beam-size effects in electro-optic sampling of terahertz pulses

Arno Schneider  »View Author Affiliations


Optics Letters, Vol. 34, Issue 7, pp. 1054-1056 (2009)
http://dx.doi.org/10.1364/OL.34.001054


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Abstract

In electro-optic sampling of terahertz pulses with a finite diameter, the probe pulse is subject to a lensing effect. The altered diffraction leads to an additional phase shift Δ η in the far field compared to the case of a plane wave. It is demonstrated that Δ η is in the same order of magnitude as the direct electro-optic phase shift at the exit of the detection crystal and thus also gives a significant contribution to the measured amplitude.

© 2009 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(230.2090) Optical devices : Electro-optical devices
(040.2235) Detectors : Far infrared or terahertz
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Spectroscopy

History
Original Manuscript: January 15, 2009
Manuscript Accepted: February 24, 2009
Published: March 25, 2009

Citation
Arno Schneider, "Beam-size effects in electro-optic sampling of terahertz pulses," Opt. Lett. 34, 1054-1056 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-7-1054

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