A novel technique, based on polarization-sensitive, frequency-domain reflectometry, for a full noninvasive characterization of spin profile in randomly birefringent spun fibers is presented. Effective measurements of spin profile in a fiber sample a few tens of meters long are reported, but the technique can be straightforwardly scaled to kilometers-long samples.
© 2009 Optical Society of America
Fiber Optics and Optical Communications
Original Manuscript: January 14, 2009
Manuscript Accepted: February 13, 2009
Published: March 27, 2009
Andrea Galtarossa, Daniele Grosso, Luca Palmieri, and Matteo Rizzo, "Spin-profile characterization in randomly birefringent spun fibers by means of frequency-domain reflectometry," Opt. Lett. 34, 1078-1080 (2009)