Multiwavelength interferometry: extended range metrology
Optics Letters, Vol. 34, Issue 7, pp. 950-952 (2009)
http://dx.doi.org/10.1364/OL.34.000950
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Abstract
We present an optimized method for multiwavelength interferometry that allows measurements beyond the largest beat wavelength. The approach exploits wavelength coincidence between two beat wavelengths in order to measure unambiguously over an extended range. Performance of the approach has been validated both through simulations and experimentally by means of a fiber interferometer for four measurement wavelengths. Initial results have demonstrated
© 2009 Optical Society of America
OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: January 7, 2009
Manuscript Accepted: February 15, 2009
Published: March 19, 2009
Citation
Konstantinos Falaggis, David P. Towers, and Catherine E. Towers, "Multiwavelength interferometry: extended range metrology," Opt. Lett. 34, 950-952 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-7-950
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