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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 7 — Apr. 1, 2009
  • pp: 950–952

Multiwavelength interferometry: extended range metrology

Konstantinos Falaggis, David P. Towers, and Catherine E. Towers  »View Author Affiliations


Optics Letters, Vol. 34, Issue 7, pp. 950-952 (2009)
http://dx.doi.org/10.1364/OL.34.000950


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Abstract

We present an optimized method for multiwavelength interferometry that allows measurements beyond the largest beat wavelength. The approach exploits wavelength coincidence between two beat wavelengths in order to measure unambiguously over an extended range. Performance of the approach has been validated both through simulations and experimentally by means of a fiber interferometer for four measurement wavelengths. Initial results have demonstrated 1 200 th of a fringe phase resolution, giving absolute metrology over 18.16 mm , or a dynamic range of 1 part in 2.4 × 10 6 . With improved phase resolution the method has the potential to range over > 100 m using femtosecond laser frequency comb sources.

© 2009 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 7, 2009
Manuscript Accepted: February 15, 2009
Published: March 19, 2009

Citation
Konstantinos Falaggis, David P. Towers, and Catherine E. Towers, "Multiwavelength interferometry: extended range metrology," Opt. Lett. 34, 950-952 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-7-950

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