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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 34, Iss. 9 — May. 1, 2009
  • pp: 1375–1377

Measurement and simulation of exciton decay times in organic light-emitting devices with different layer structures

Saso Mladenovski, Sebastian Reineke, and Kristiaan Neyts  »View Author Affiliations


Optics Letters, Vol. 34, Issue 9, pp. 1375-1377 (2009)
http://dx.doi.org/10.1364/OL.34.001375


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Abstract

The decay time of an exciton depends on the coupling between the dipole oscillator and the optical environment in which it is placed. For an organic light-emitting device this environment is determined by the thin-film layer structure. The radiative decay competes with nonradiative decay channels and in this way influences the luminescent efficiency and the external quantum efficiency of the device. We describe a method to estimate the dependency of the exciton decay time and the luminescent efficiency on the thin-film stack and validate the results experimentally.

© 2009 Optical Society of America

OCIS Codes
(160.4890) Materials : Organic materials
(230.3670) Optical devices : Light-emitting diodes
(310.6860) Thin films : Thin films, optical properties
(310.6845) Thin films : Thin film devices and applications

ToC Category:
Thin Films

History
Original Manuscript: February 12, 2009
Revised Manuscript: March 19, 2009
Manuscript Accepted: March 27, 2009
Published: April 22, 2009

Citation
Saso Mladenovski, Sebastian Reineke, and Kristiaan Neyts, "Measurement and simulation of exciton decay times in organic light-emitting devices with different layer structures," Opt. Lett. 34, 1375-1377 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-9-1375


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