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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 34, Iss. 9 — May. 1, 2009
  • pp: 1402–1404

Direct measurement high resolution wide range extreme temperature optical sensor using an all-silicon carbide probe

Mumtaz Sheikh and Nabeel A. Riza  »View Author Affiliations


Optics Letters, Vol. 34, Issue 9, pp. 1402-1404 (2009)
http://dx.doi.org/10.1364/OL.34.001402


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Abstract

We propose and demonstrate a temperature sensing method using an all-silicon carbide probe that combines wavelength-tuned signal processing for coarse measurements and classical Fabry–Perot etalon peak shift for fine measurements. This method gives direct unambiguous temperature measurements with a high temperature resolution over a wide temperature range. Specifically, temperature measurements from room temperature to 1000 ° C are experimentally demonstrated with an estimated resolution varying from 0.66 ° C at room temperature to 0.12 ° C at 1000 ° C . The proposed sensor has applications in next-generation greener gas turbines for power production.

© 2009 Optical Society of America

OCIS Codes
(050.2230) Diffraction and gratings : Fabry-Perot
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(280.4788) Remote sensing and sensors : Optical sensing and sensors
(280.6780) Remote sensing and sensors : Temperature

ToC Category:
Remote Sensing and Sensors

History
Original Manuscript: February 24, 2009
Manuscript Accepted: March 17, 2009
Published: April 24, 2009

Citation
Mumtaz Sheikh and Nabeel A. Riza, "Direct measurement high resolution wide range extreme temperature optical sensor using an all-silicon carbide probe," Opt. Lett. 34, 1402-1404 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-9-1402

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