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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 34, Iss. 9 — May. 1, 2009
  • pp: 1429–1431

Polarization-ratio reflectance measurements in the extreme ultraviolet

N. Brimhall, N. Heilmann, M. Ware, and J. Peatross  »View Author Affiliations

Optics Letters, Vol. 34, Issue 9, pp. 1429-1431 (2009)

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We demonstrate a technique for determining optical constants of materials in the extreme UV from the ratio of p-polarized to s-polarized reflectance. The measurements are based on laser-generated high-order harmonics, which have easily rotatable linear polarization but that are prone to brightness fluctuations and systematic drifts during measurement. Rather than measure the absolute reflectance, we extract the optical constants of a material from the ratio of p-polarized to s-polarized reflectance at multiple incident angles. This has the advantage of dividing out long-term fluctuations and possible systematic errors. We show that the reflectance ratio is as sensitive as the absolute reflectance to material optical properties.

© 2009 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
X-ray Optics

Original Manuscript: January 29, 2009
Revised Manuscript: March 7, 2009
Manuscript Accepted: March 25, 2009
Published: April 28, 2009

N. Brimhall, N. Heilmann, M. Ware, and J. Peatross, "Polarization-ratio reflectance measurements in the extreme ultraviolet," Opt. Lett. 34, 1429-1431 (2009)

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