Submillimeter spectroscopy for chemical analysis with absolute specificity
Optics Letters, Vol. 35, Issue 10, pp. 1533-1535 (2010)
http://dx.doi.org/10.1364/OL.35.001533
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Abstract
A sensor based on rotational signatures in the submillimeter (SMM) region is described. This sensor uses frequency synthesis techniques in the region around
© 2010 Optical Society of America
OCIS Codes
(300.1030) Spectroscopy : Absorption
(300.6320) Spectroscopy : Spectroscopy, high-resolution
(300.6370) Spectroscopy : Spectroscopy, microwave
(300.6390) Spectroscopy : Spectroscopy, molecular
(280.1545) Remote sensing and sensors : Chemical analysis
(300.6495) Spectroscopy : Spectroscopy, teraherz
ToC Category:
Spectroscopy
History
Original Manuscript: December 21, 2009
Revised Manuscript: March 9, 2010
Manuscript Accepted: March 19, 2010
Published: May 5, 2010
Citation
Ivan R. Medvedev, Christopher F. Neese, Grant M. Plummer, and Frank C. De Lucia, "Submillimeter spectroscopy for chemical analysis with absolute specificity," Opt. Lett. 35, 1533-1535 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-10-1533
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