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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 10 — May. 15, 2010
  • pp: 1533–1535

Submillimeter spectroscopy for chemical analysis with absolute specificity

Ivan R. Medvedev, Christopher F. Neese, Grant M. Plummer, and Frank C. De Lucia  »View Author Affiliations

Optics Letters, Vol. 35, Issue 10, pp. 1533-1535 (2010)

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A sensor based on rotational signatures in the submillimeter (SMM) region is described. This sensor uses frequency synthesis techniques in the region around 10 GHz , with nonlinear diode frequency multiplication to 210 270 GHz . This provides not only a nearly ideal instrument function, but also frequency control and agility that significantly enhance the performance of the spectrometer as a sensor. The SMM frequencies provide significantly stronger absorptions and broader spectroscopic coverage than lower-frequency microwave systems. Among the characteristics of the sensor are absolute specificity, low atmospheric clutter, good sensitivity, and near-term paths to systems that are both compact and very inexpensive.

© 2010 Optical Society of America

OCIS Codes
(300.1030) Spectroscopy : Absorption
(300.6320) Spectroscopy : Spectroscopy, high-resolution
(300.6370) Spectroscopy : Spectroscopy, microwave
(300.6390) Spectroscopy : Spectroscopy, molecular
(280.1545) Remote sensing and sensors : Chemical analysis
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:

Original Manuscript: December 21, 2009
Revised Manuscript: March 9, 2010
Manuscript Accepted: March 19, 2010
Published: May 5, 2010

Ivan R. Medvedev, Christopher F. Neese, Grant M. Plummer, and Frank C. De Lucia, "Submillimeter spectroscopy for chemical analysis with absolute specificity," Opt. Lett. 35, 1533-1535 (2010)

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