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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 35, Iss. 11 — Jun. 1, 2010
  • pp: 1768–1770

Vertical scanning white-light interference microscopy on curved microstructures

Peter Lehmann  »View Author Affiliations


Optics Letters, Vol. 35, Issue 11, pp. 1768-1770 (2010)
http://dx.doi.org/10.1364/OL.35.001768


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Abstract

Although white-light interferometers have become well-established tools for measuring smooth, rough, and microstructured surfaces, there are some limitations in certain applications, e.g., if tilted surface areas or small radii of curvature are to be measured. Since the correction of chromatic aberrations is not perfect over the total field of view or the total pupil plane, dispersion differences occur for different ray paths of the microscopic imaging system. The influence of these effects is discussed on the basis of the most commonly used Mirau interferometer, and the resulting systematic measuring errors are explained.

© 2010 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 1, 2010
Revised Manuscript: April 20, 2010
Manuscript Accepted: April 27, 2010
Published: May 18, 2010

Citation
Peter Lehmann, "Vertical scanning white-light interference microscopy on curved microstructures," Opt. Lett. 35, 1768-1770 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-11-1768


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