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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 11 — Jun. 1, 2010
  • pp: 1792–1794

Sensitive micromechanical displacement detection by scattering evanescent optical waves

Onur Basarir, Suraj Bramhavar, Gilberto Basilio-Sanchez, Theodore Morse, and Kamil L. Ekinci  »View Author Affiliations


Optics Letters, Vol. 35, Issue 11, pp. 1792-1794 (2010)
http://dx.doi.org/10.1364/OL.35.001792


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Abstract

We describe a simple approach to detect small mechanical displacements by scattering evanescent optical waves confined around an optical waveguide. Our experimental setup consists of a microcantilever brought into the proximity of a tapered optical fiber. The scattering of evanescent waves and hence the optical transmission through the tapered fiber is strongly dependent on the separation between the fiber and the microcantilever, allowing for sensitive detection of the small oscillations of the microcantilever. Our approach does not require a coherent laser source, yet it provides a displacement sensitivity of ~ 260 fm Hz 1 / 2 at a small power level of 38 μW . It is suitable for scanning probe microscopy and could eventually be adapted to nanomechanical resonators.

© 2010 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis
(120.4880) Instrumentation, measurement, and metrology : Optomechanics

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 24, 2010
Revised Manuscript: April 20, 2010
Manuscript Accepted: April 23, 2010
Published: May 19, 2010

Citation
Onur Basarir, Suraj Bramhavar, Gilberto Basilio-Sanchez, Theodore Morse, and Kamil L. Ekinci, "Sensitive micromechanical displacement detection by scattering evanescent optical waves," Opt. Lett. 35, 1792-1794 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-11-1792

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