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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 11 — Jun. 1, 2010
  • pp: 1920–1922

Improved interferometric tracking of trapped particles using two frequency-detuned beams

Lars Friedrich and Alexander Rohrbach  »View Author Affiliations

Optics Letters, Vol. 35, Issue 11, pp. 1920-1922 (2010)

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For most optical tweezer applications, precise and reliable tracking of the trapped particle is an important requirement. Backfocal-plane interferometry is the fastest and most accurate tracking technique if the particle displacements are limited to half of the focal width. Especially for positive axial displacements, the nonlinear detector response can lead to incorrect tracking results. Here we show how the linear detection range around the trap center can be extended by a factor of 2 to 4 in the axial direction using a second frequency-detuned tracking focus that is generated by the same laser as the optical trap. Additionally, we show how the noise in the axial signal can be decreased significantly using a second detector.

© 2010 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(140.7010) Lasers and laser optics : Laser trapping
(260.3160) Physical optics : Interference
(290.0290) Scattering : Scattering

ToC Category:

Original Manuscript: February 25, 2010
Manuscript Accepted: April 26, 2010
Published: May 28, 2010

Virtual Issues
Vol. 5, Iss. 10 Virtual Journal for Biomedical Optics

Lars Friedrich and Alexander Rohrbach, "Improved interferometric tracking of trapped particles using two frequency-detuned beams," Opt. Lett. 35, 1920-1922 (2010)

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