Optical transmission through double-layer, laterally shifted metallic subwavelength hole arrays
Optics Letters, Vol. 35, Issue 13, pp. 2124-2126 (2010)
http://dx.doi.org/10.1364/OL.35.002124
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Abstract
We measure the transmission of IR radiation through double-layer metal films with periodic arrays of subwavelength holes. When the two metal films are placed in sufficiently close proximity, two types of transmission resonances emerge. For the surface plasmon mode, the electromagnetic field is concentrated on the outer surface of the entire metallic layer stack. In contrast, for the guided mode, the field is confined to the gap between the two metal layers. Our measurements indicate that, as the two layers are laterally shifted from perfect alignment, the peak transmission frequency of the guided mode decreases significantly, while that of the surface plasmon mode remains largely unchanged, in agreement with numerical calculations.
© 2010 Optical Society of America
OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(240.6680) Optics at surfaces : Surface plasmons
(240.6690) Optics at surfaces : Surface waves
(310.6860) Thin films : Thin films, optical properties
(310.4165) Thin films : Multilayer design
(310.6628) Thin films : Subwavelength structures, nanostructures
ToC Category:
Diffraction and Gratings
History
Original Manuscript: February 11, 2010
Revised Manuscript: April 30, 2010
Manuscript Accepted: May 17, 2010
Published: June 16, 2010
Citation
Z. Marcet, Z. H. Hang, C. T. Chan, I. Kravchenko, J. E. Bower, R. A. Cirelli, F. Klemens, W. M. Mansfield, J. F. Miner, C. S. Pai, and H. B. Chan, "Optical transmission through double-layer, laterally shifted metallic subwavelength hole arrays," Opt. Lett. 35, 2124-2126 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-13-2124
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