We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM.
© 2010 Optical Society of America
Original Manuscript: May 19, 2010
Manuscript Accepted: June 14, 2010
Published: July 14, 2010
Dana C. Kohlgraf-Owens, David Haefner, Sergey Sukhov, and Aristide Dogariu, "Intrinsic detection of scattering phase with near-field scanning optical microscope," Opt. Lett. 35, 2463-2465 (2010)