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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 14 — Jul. 15, 2010
  • pp: 2463–2465

Intrinsic detection of scattering phase with near-field scanning optical microscope

Dana C. Kohlgraf-Owens, David Haefner, Sergey Sukhov, and Aristide Dogariu  »View Author Affiliations


Optics Letters, Vol. 35, Issue 14, pp. 2463-2465 (2010)
http://dx.doi.org/10.1364/OL.35.002463


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Abstract

We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM.

© 2010 Optical Society of America

OCIS Codes
(110.3175) Imaging systems : Interferometric imaging
(180.4243) Microscopy : Near-field microscopy

ToC Category:
Microscopy

History
Original Manuscript: May 19, 2010
Manuscript Accepted: June 14, 2010
Published: July 14, 2010

Citation
Dana C. Kohlgraf-Owens, David Haefner, Sergey Sukhov, and Aristide Dogariu, "Intrinsic detection of scattering phase with near-field scanning optical microscope," Opt. Lett. 35, 2463-2465 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-14-2463


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