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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 2 — Jan. 15, 2010
  • pp: 208–210

Topography and refractometry of nanostructures using spatial light interference microscopy

Zhuo Wang, Ik Su Chun, Xiuling Li, Zhun-Yong Ong, Eric Pop, Larry Millet, Martha Gillette, and Gabriel Popescu  »View Author Affiliations

Optics Letters, Vol. 35, Issue 2, pp. 208-210 (2010)

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Spatial light interference microscopy (SLIM) is a novel method developed in our laboratory that provides quantitative phase images of transparent structures with a 0.3 nm spatial and 0.03 nm temporal accuracy owing to the white light illumination and its common path interferometric geometry. We exploit these features and demonstrate SLIM’s ability to perform topography at a single atomic layer in graphene. Further, using a decoupling procedure that we developed for cylindrical structures, we extract the axially averaged refractive index of semiconductor nanotubes and a neurite of a live hippocampal neuron in culture. We believe that this study will set the basis for novel high-throughput topography and refractometry of man-made and biological nanostructures.

© 2010 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 8, 2009
Revised Manuscript: November 15, 2009
Manuscript Accepted: November 24, 2009
Published: January 14, 2010

Virtual Issues
Vol. 5, Iss. 3 Virtual Journal for Biomedical Optics

Zhuo Wang, Ik Su Chun, Xiuling Li, Zhun-Yong Ong, Eric Pop, Larry Millet, Martha Gillette, and Gabriel Popescu, "Topography and refractometry of nanostructures using spatial light interference microscopy," Opt. Lett. 35, 208-210 (2010)

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