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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 35, Iss. 20 — Oct. 15, 2010
  • pp: 3312–3314

In situ spatial mapping of Gouy phase slip for high-detail attosecond pump–probe measurements

Niranjan Shivaram, Adam Roberts, Lei Xu, and Arvinder Sandhu  »View Author Affiliations


Optics Letters, Vol. 35, Issue 20, pp. 3312-3314 (2010)
http://dx.doi.org/10.1364/OL.35.003312


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Abstract

Attosecond pump–probe experiments routinely utilize extreme ultraviolet (XUV) and IR fields, with relative phase being the variable parameter. However, the Gouy phase slip between the focused IR and XUV pulses inevitably leads to a certain amount of phase averaging and loss of accuracy. By using ion imaging, we establish a one-to-one mapping between the local phase slip and the spatial coordinates of the focal volume, thus performing in situ characterization of the Gouy phase of a complex beam and its role in ionization of He and Xe. We demonstrate that spatially discriminated ion imaging enhances the contrast of a phase-dependent XUV + IR ionization signal. We utilize our technique to unmask a weak ionization asymmetry, thus opening pathways for further high-precision attosecond studies.

© 2010 Optical Society of America

OCIS Codes
(020.4180) Atomic and molecular physics : Multiphoton processes
(300.6530) Spectroscopy : Spectroscopy, ultrafast
(300.6540) Spectroscopy : Spectroscopy, ultraviolet
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Spectroscopy

History
Original Manuscript: May 24, 2010
Revised Manuscript: August 5, 2010
Manuscript Accepted: September 5, 2010
Published: October 7, 2010

Citation
Niranjan Shivaram, Adam Roberts, Lei Xu, and Arvinder Sandhu, "In situ spatial mapping of Gouy phase slip for high-detail attosecond pump–probe measurements," Opt. Lett. 35, 3312-3314 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-20-3312


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