In situ spatial mapping of Gouy phase slip for high-detail attosecond pump–probe measurements
Optics Letters, Vol. 35, Issue 20, pp. 3312-3314 (2010)
http://dx.doi.org/10.1364/OL.35.003312
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Abstract
Attosecond pump–probe experiments routinely utilize extreme ultraviolet (XUV) and IR fields, with relative phase being the variable parameter. However, the Gouy phase slip between the focused IR and XUV pulses inevitably leads to a certain amount of phase averaging and loss of accuracy. By using ion imaging, we establish a one-to-one mapping between the local phase slip and the spatial coordinates of the focal volume, thus performing in situ characterization of the Gouy phase of a complex beam and its role in ionization of He and Xe. We demonstrate that spatially discriminated ion imaging enhances the contrast of a phase-dependent
© 2010 Optical Society of America
OCIS Codes
(020.4180) Atomic and molecular physics : Multiphoton processes
(300.6530) Spectroscopy : Spectroscopy, ultrafast
(300.6540) Spectroscopy : Spectroscopy, ultraviolet
(320.7100) Ultrafast optics : Ultrafast measurements
ToC Category:
Spectroscopy
History
Original Manuscript: May 24, 2010
Revised Manuscript: August 5, 2010
Manuscript Accepted: September 5, 2010
Published: October 7, 2010
Citation
Niranjan Shivaram, Adam Roberts, Lei Xu, and Arvinder Sandhu, "In situ spatial mapping of Gouy phase slip for high-detail attosecond pump–probe measurements," Opt. Lett. 35, 3312-3314 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-20-3312
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