Resolution improvement in optical projection tomography by the focal scanning method
Optics Letters, Vol. 35, Issue 20, pp. 3363-3365 (2010)
http://dx.doi.org/10.1364/OL.35.003363
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Abstract
Optical projection tomography (OPT) requires the depth of field (DOF) of the lens to cover at least half of the sample. There is a trade-off between obtaining high resolution with a high-NA lens and obtaining large DOF with a low-NA lens. The DOF of a high-NA objective lens can be extended by scanning its focal plane through the sample. We call this extended DOF image a “pseudoprojection.” Images reconstructed from these pseudoprojections have isometric resolution, which can be the same as the lateral resolution of the high-NA objective. The focal scanning method produces an over
© 2010 Optical Society of America
OCIS Codes
(180.6900) Microscopy : Three-dimensional microscopy
(110.6955) Imaging systems : Tomographic imaging
ToC Category:
Microscopy
History
Original Manuscript: July 8, 2010
Revised Manuscript: August 31, 2010
Manuscript Accepted: September 7, 2010
Published: October 8, 2010
Citation
Qin Miao, Jon Hayenga, Michael G. Meyer, Thomas Neumann, Alan C. Nelson, and Eric J. Seibel, "Resolution improvement in optical projection tomography by the focal scanning method," Opt. Lett. 35, 3363-3365 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-20-3363
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