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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 20 — Oct. 15, 2010
  • pp: 3363–3365

Resolution improvement in optical projection tomography by the focal scanning method

Qin Miao, Jon Hayenga, Michael G. Meyer, Thomas Neumann, Alan C. Nelson, and Eric J. Seibel  »View Author Affiliations


Optics Letters, Vol. 35, Issue 20, pp. 3363-3365 (2010)
http://dx.doi.org/10.1364/OL.35.003363


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Abstract

Optical projection tomography (OPT) requires the depth of field (DOF) of the lens to cover at least half of the sample. There is a trade-off between obtaining high resolution with a high-NA lens and obtaining large DOF with a low-NA lens. The DOF of a high-NA objective lens can be extended by scanning its focal plane through the sample. We call this extended DOF image a “pseudoprojection.” Images reconstructed from these pseudoprojections have isometric resolution, which can be the same as the lateral resolution of the high-NA objective. The focal scanning method produces an over 10 × improvement in OPT resolution.

© 2010 Optical Society of America

OCIS Codes
(180.6900) Microscopy : Three-dimensional microscopy
(110.6955) Imaging systems : Tomographic imaging

ToC Category:
Microscopy

History
Original Manuscript: July 8, 2010
Revised Manuscript: August 31, 2010
Manuscript Accepted: September 7, 2010
Published: October 8, 2010

Citation
Qin Miao, Jon Hayenga, Michael G. Meyer, Thomas Neumann, Alan C. Nelson, and Eric J. Seibel, "Resolution improvement in optical projection tomography by the focal scanning method," Opt. Lett. 35, 3363-3365 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-20-3363


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