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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 20 — Oct. 15, 2010
  • pp: 3489–3491

Dark-field optical coherence microscopy

Martin Villiger, Christophe Pache, and Theo Lasser  »View Author Affiliations

Optics Letters, Vol. 35, Issue 20, pp. 3489-3491 (2010)

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Dark-field illumination is known to enhance scattering contrast in optical microscopy. We combined this concept with Fourier domain optical coherence microscopy (OCM). The detection and illumination paths are decoupled, and only the scattered light originating from the sample generates the tomogram signal, whereas any specular reflection is highly suppressed. We analyze and discuss this dark-field OCM concept and present its superior imaging quality on live cell samples.

© 2010 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(170.1530) Medical optics and biotechnology : Cell analysis
(180.1655) Microscopy : Coherence tomography

ToC Category:

Original Manuscript: June 24, 2010
Revised Manuscript: September 1, 2010
Manuscript Accepted: September 13, 2010
Published: October 13, 2010

Martin Villiger, Christophe Pache, and Theo Lasser, "Dark-field optical coherence microscopy," Opt. Lett. 35, 3489-3491 (2010)

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