Abstract

A two-substrate method is developed to simultaneously determine emissivity, transmittance, and reflectance of semitransparent materials with a single measurement under the same environment at elevated temperature. The three quantities can be obtained through the emissivities of substrates and the apparent emissivities resulting from the radiance of the sample heated by substrates. The two-substrate method is compared with the conventional method by measuring sapphire samples with various thicknesses, resulting in good agreements for all the samples. The present method will be useful to measure the temperature dependence of optical properties of porous ceramic materials.

© 2010 Optical Society of America

Radiation temperature measurement method for semitransparent materials using one-channel infrared pyrometer

Tairan Fu, Jiangfan Liu, and Anzhou Zong
Appl. Opt. 53(29) 6830-6839 (2014)

Optical temperature measurements of silicon microbridge emitters

Maksim Shpak, Lauri Sainiemi, Maija Ojanen, Petri Kärhä, Martti Heinonen, Sami Franssila, and Erkki Ikonen
Appl. Opt. 49(9) 1489-1493 (2010)

Measurement of Total Hemispherical Emittance of Transparent Materials at Low Temperature

E. R. Schleiger
Appl. Opt. 6(5) 919-923 (1967)

Facility for assessing spectral normal emittance of solid materials at high temperature

Luca Mercatelli, Marco Meucci, and Elisa Sani
Appl. Opt. 54(29) 8700-8705 (2015)

Integrated approach for simultaneously measuring thermophysical parameters of semi-transparent materials

Yanfen Xu, Kaihua Zhang, Kun Yu, and Yufang Liu
Opt. Lett. 49(7) 1812-1815 (2024)