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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 23 — Dec. 1, 2010
  • pp: 4015–4017

Simultaneous measurement of emittance, transmittance, and reflectance of semitransparent materials at elevated temperature

Sangho Jeon, Seung-Nam Park, Yong Shim Yoo, Jisoo Hwang, Chul-Woung Park, and Geun Woo Lee  »View Author Affiliations

Optics Letters, Vol. 35, Issue 23, pp. 4015-4017 (2010)

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A two-substrate method is developed to simultaneously determine emissivity, transmittance, and reflectance of semitransparent materials with a single measurement under the same environment at elevated temperature. The three quantities can be obtained through the emissivities of substrates and the apparent emissivities resulting from the radiance of the sample heated by substrates. The two-substrate method is compared with the conventional method by measuring sapphire samples with various thicknesses, resulting in good agreements for all the samples. The present method will be useful to measure the temperature dependence of optical properties of porous ceramic materials.

© 2010 Optical Society of America

OCIS Codes
(080.2720) Geometric optics : Mathematical methods (general)
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(300.6340) Spectroscopy : Spectroscopy, infrared

Original Manuscript: August 16, 2010
Revised Manuscript: October 25, 2010
Manuscript Accepted: October 31, 2010
Published: November 24, 2010

Sangho Jeon, Seung-Nam Park, Yong Shim Yoo, Jisoo Hwang, Chul-Woung Park, and Geun Woo Lee, "Simultaneous measurement of emittance, transmittance, and reflectance of semitransparent materials at elevated temperature," Opt. Lett. 35, 4015-4017 (2010)

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