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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 35, Iss. 23 — Dec. 1, 2010
  • pp: 4084–4086

Linear polarization degree for detecting magnetic properties of small particles

Braulio García-Cámara, Francisco González, and Fernando Moreno  »View Author Affiliations


Optics Letters, Vol. 35, Issue 23, pp. 4084-4086 (2010)
http://dx.doi.org/10.1364/OL.35.004084


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Abstract

Motivated by the recent advances with magnetic nanoparticles, in this research we propose a new technique for their characterization based on the measurement of certain polarimetric parameters of the scattered light, such as the linear polarization degree when it is determined at a “right-angle” scattering configuration. We will show the sensitivity of its spectral evolution with the magnetic properties of the particle.

© 2010 Optical Society of America

OCIS Codes
(160.4236) Materials : Nanomaterials
(290.5855) Scattering : Scattering, polarization

ToC Category:
Materials

History
Original Manuscript: September 14, 2010
Revised Manuscript: October 20, 2010
Manuscript Accepted: October 29, 2010
Published: November 30, 2010

Citation
Braulio García-Cámara, Francisco González, and Fernando Moreno, "Linear polarization degree for detecting magnetic properties of small particles," Opt. Lett. 35, 4084-4086 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-23-4084


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