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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 3 — Feb. 1, 2010
  • pp: 366–368

Wide-spectrum reconstruction method for a birefringence interference imaging spectrometer

Chunmin Zhang and Xiaohua Jian  »View Author Affiliations

Optics Letters, Vol. 35, Issue 3, pp. 366-368 (2010)

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We present a mathematical method used to determine the spectrum detected by a birefringence interference imaging spectrometer (BIIS). The reconstructed spectrum has good precision over a wide spectral range, 0.4 1.0 μ m . This method considers the light intensity as a function of wavelength and avoids the fatal error caused by birefringence effect in the conventional Fourier transform method. The experimental interferogram of the BIIS is processed in this new way, and the interference data and reconstructed spectrum are in good agreement, proving this method to be very exact and useful. Application of this method will greatly improve the instrument performance.

© 2010 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6190) Spectroscopy : Spectrometers
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:

Original Manuscript: November 5, 2009
Revised Manuscript: December 11, 2009
Manuscript Accepted: December 14, 2009
Published: January 26, 2010

Chunmin Zhang and Xiaohua Jian, "Wide-spectrum reconstruction method for a birefringence interference imaging spectrometer," Opt. Lett. 35, 366-368 (2010)

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