Measuring near-field nanoparticle concentration profiles by correlating surface plasmon resonance reflectance with effective refractive index of nanofluids
Optics Letters, Vol. 35, Issue 3, pp. 393-395 (2010)
http://dx.doi.org/10.1364/OL.35.000393
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Abstract
Time-dependent and near-field nanoparticle concentrations are determined by correlating the surface plasmon resonance (SPR) reflectance intensities with the effective refractive index (ERI) of the nanofluid under evaporation. A critical angle measurement for total internal reflection identifies the ERI of the nanofluid at different nanoparticle concentrations. The corresponding SPR reflectance intensities correlate the nanofluidic ERI with the nanoparticle concentrations. Example applications for evaporating nanofluidic droplets containing
© 2010 Optical Society of America
OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(130.6010) Integrated optics : Sensors
(240.6680) Optics at surfaces : Surface plasmons
ToC Category:
Optics at Surfaces
History
Original Manuscript: September 9, 2009
Revised Manuscript: November 23, 2009
Manuscript Accepted: December 3, 2009
Published: January 29, 2010
Citation
Iltai Kim and Kenneth D. Kihm, "Measuring near-field nanoparticle concentration profiles by correlating surface plasmon resonance reflectance with effective refractive index of nanofluids," Opt. Lett. 35, 393-395 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-3-393
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