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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 3 — Feb. 1, 2010
  • pp: 393–395

Measuring near-field nanoparticle concentration profiles by correlating surface plasmon resonance reflectance with effective refractive index of nanofluids

Iltai Kim and Kenneth D. Kihm  »View Author Affiliations

Optics Letters, Vol. 35, Issue 3, pp. 393-395 (2010)

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Time-dependent and near-field nanoparticle concentrations are determined by correlating the surface plasmon resonance (SPR) reflectance intensities with the effective refractive index (ERI) of the nanofluid under evaporation. A critical angle measurement for total internal reflection identifies the ERI of the nanofluid at different nanoparticle concentrations. The corresponding SPR reflectance intensities correlate the nanofluidic ERI with the nanoparticle concentrations. Example applications for evaporating nanofluidic droplets containing 47 nm Al 2 O 3 particles demonstrate the feasibility of this new imaging tool for measuring time-resolved and full-field nanoparticle concentration profiles.

© 2010 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(130.6010) Integrated optics : Sensors
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Optics at Surfaces

Original Manuscript: September 9, 2009
Revised Manuscript: November 23, 2009
Manuscript Accepted: December 3, 2009
Published: January 29, 2010

Iltai Kim and Kenneth D. Kihm, "Measuring near-field nanoparticle concentration profiles by correlating surface plasmon resonance reflectance with effective refractive index of nanofluids," Opt. Lett. 35, 393-395 (2010)

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