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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 3 — Feb. 1, 2010
  • pp: 438–440

Photonic approach for multiple-frequency-component measurement using spectrally sliced incoherent source

Xihua Zou, Wei Pan, Bin Luo, and Lianshan Yan  »View Author Affiliations

Optics Letters, Vol. 35, Issue 3, pp. 438-440 (2010)

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A photonic approach to the instantaneous measurement of multiple frequency components using a spectrally sliced incoherent source (SSIS) is proposed. In the proposed system, a broadband incoherent source is spectrally sliced using an etalon to generate an SSIS. Each channel of the SSIS is externally modulated by a microwave signal containing multiple frequency components. The modulated SSIS is then sent to a second etalon. Thanks to the difference between the free spectral ranges of the two etalons, multiple frequency components are simultaneously estimated from the power distribution at the output channels of the second etalon. Compared with the use of a laser source array, the use of an SSIS provides a simpler way to perform multiple-frequency-component measurement.

© 2010 Optical Society of America

OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(060.5625) Fiber optics and optical communications : Radio frequency photonics

ToC Category:
Fiber Optics and Optical Communications

Original Manuscript: September 24, 2009
Revised Manuscript: December 18, 2009
Manuscript Accepted: December 21, 2009
Published: January 29, 2010

Xihua Zou, Wei Pan, Bin Luo, and Lianshan Yan, "Photonic approach for multiple-frequency-component measurement using spectrally sliced incoherent source," Opt. Lett. 35, 438-440 (2010)

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