Optical probing of electric fields with an electro-acoustic effect toward integrated circuit diagnosis
Optics Letters, Vol. 35, Issue 4, pp. 580-582 (2010)
http://dx.doi.org/10.1364/OL.35.000580
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Abstract
Electro-optic probing of electric fields has been considered as a promising approach for integrated circuit diagnosis. However, the method is subject to relatively weak voltage sensitivity. In this Letter, we solve the problems with electro-acoustic effect. In contrast to the general electro-optic effect, the light phase modulation induced by the acoustic effect is 2 orders of magnitude stronger at its resonant frequency, as we observed in a GaAs thin film probe. Furthermore, this what we believe to be a novel method shows a highly reproducible linearity between the detected signals and the input voltages, which facilitates the voltage calibration.
© 2010 Optical Society of America
OCIS Codes
(230.1040) Optical devices : Acousto-optical devices
(230.2090) Optical devices : Electro-optical devices
(260.5740) Physical optics : Resonance
(280.3420) Remote sensing and sensors : Laser sensors
(310.6860) Thin films : Thin films, optical properties
(280.4788) Remote sensing and sensors : Optical sensing and sensors
ToC Category:
Optoelectronics
History
Original Manuscript: October 26, 2009
Revised Manuscript: December 19, 2009
Manuscript Accepted: December 29, 2009
Published: February 11, 2010
Citation
Ru-Long Jin, Han Yang, Di Zhao, Qi-Dai Chen, Zhao-Xu Yan, Mao-Bin Yi, and Hong-Bo Sun, "Optical probing of electric fields with an electro-acoustic effect toward integrated circuit diagnosis," Opt. Lett. 35, 580-582 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-4-580
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