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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 6 — Mar. 15, 2010
  • pp: 841–843

Determination of the refractive index of a dielectric film continuously by the generalized S-transform

Emre Coşkun, Kıvanç Sel, and Serhat Özder  »View Author Affiliations


Optics Letters, Vol. 35, Issue 6, pp. 841-843 (2010)
http://dx.doi.org/10.1364/OL.35.000841


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Abstract

The generalized S-transform was improved as a method to determine the refractive index of a dielectric film continuously by using the transmittance spectrum, and the applicability of the method was demonstrated on mica. The result determined from the generalized S-transform method was compared with the results determined from the S-transform and the fringe counting methods and published values. The advantage of the proposed method was explained, and the absolute error of the presented method was also calculated.

© 2010 Optical Society of America

OCIS Codes
(070.4560) Fourier optics and signal processing : Data processing by optical means
(200.4560) Optics in computing : Optical data processing
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Optical Computing

History
Original Manuscript: October 22, 2009
Revised Manuscript: January 7, 2010
Manuscript Accepted: February 2, 2010
Published: March 12, 2010

Citation
Emre Coşkun, Kıvanç Sel, and Serhat Özder, "Determination of the refractive index of a dielectric film continuously by the generalized S-transform," Opt. Lett. 35, 841-843 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-6-841

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