A new method, to our knowledge, for real-time direct access to depth information in scanning fluorescence microscopy is reported. It is based on axially exciting the sample and detecting the phase and intensity of the emitted light. Results obtained using an axicon lens to generate a Bessel beam for excitation and a microlens array as phase detector are presented.
© 2010 Optical Society of America
Original Manuscript: October 29, 2009
Revised Manuscript: February 15, 2010
Manuscript Accepted: February 25, 2010
Published: March 31, 2010
Vol. 5, Iss. 8 Virtual Journal for Biomedical Optics
Ignacio Iglesias, "Fluorescence tomographic microscopy by wavefront detection," Opt. Lett. 35, 1103-1105 (2010)