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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 9 — May. 1, 2010
  • pp: 1377–1379

Ultrashort pulse characterization in the mid-infrared

P. K. Bates, O. Chalus, and J. Biegert  »View Author Affiliations

Optics Letters, Vol. 35, Issue 9, pp. 1377-1379 (2010)

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We describe a second-harmonic-generation frequency-resolved optical gating measurement device optimized for the characterization of few-cycle pulses in the mid-IR spectral range. The system has a temporal range of 100 ps with resolution of 0.12 fs , and it is capable of measuring pulses as short as 1.5   cycles   ( 15    fs ) at 3 μ m . Through interchangeable beam splitters and detectors it covers a wavelength range from 800 nm to 5 μ m with up to 0.5 cm 1 resolution. We demonstrate measurement of a richly featured 3.2 μ m pulse with 9.6   cycle duration, recovering the main pulse of 96 fs , as well as low-intensity post-pulses with picosecond offset. We also characterize a 100 fs pulse after dispersion through a 1 cm sapphire plate, comparing the measured phase difference with the calculated one.

© 2010 Optical Society of America

OCIS Codes
(190.4360) Nonlinear optics : Nonlinear optics, devices
(230.4320) Optical devices : Nonlinear optical devices
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

Original Manuscript: December 7, 2009
Revised Manuscript: March 12, 2010
Manuscript Accepted: March 16, 2010
Published: April 26, 2010

P. K. Bates, O. Chalus, and J. Biegert, "Ultrashort pulse characterization in the mid-infrared," Opt. Lett. 35, 1377-1379 (2010)

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