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Optics Letters

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  • Vol. 36, Iss. 1 — Jan. 1, 2011
  • pp: 1–3

Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses

A. M. Sayler, Tim Rathje, Walter Müller, Klaus Rühle, R. Kienberger, and G. G. Paulus  »View Author Affiliations


Optics Letters, Vol. 36, Issue 1, pp. 1-3 (2011)
http://dx.doi.org/10.1364/OL.36.000001


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Abstract

In this Letter we demonstrate a method for real-time determination of the carrier-envelope phase of each and every single ultrashort laser pulse at kilohertz repetition rates. The technique expands upon the recent work of Wittmann and incorporates a stereographic above-threshold laser-induced ionization measurement and electronics optimized to produce a signal corresponding to the carrier-envelope phase within microseconds of the laser interaction, thereby facilitating data-tagging and feedback applications. We achieve a precision of 113 mrad ( 6.5 ° ) over the entire 2 π range.

© 2011 Optical Society of America

OCIS Codes
(020.4180) Atomic and molecular physics : Multiphoton processes
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology
(020.2649) Atomic and molecular physics : Strong field laser physics

ToC Category:
Ultrafast Optics

History
Original Manuscript: May 27, 2010
Revised Manuscript: October 11, 2010
Manuscript Accepted: October 27, 2010
Published: December 16, 2010

Citation
A. M. Sayler, Tim Rathje, Walter Müller, Klaus Rühle, R. Kienberger, and G. G. Paulus, "Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses," Opt. Lett. 36, 1-3 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-1-1


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