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Focusing light with a reflection photon sieve |
Optics Letters, Vol. 36, Issue 13, pp. 2405-2407 (2011)
http://dx.doi.org/10.1364/OL.36.002405
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Abstract
An advanced type of diffractive optical element is presented that combines the concept of the photon sieve with an off-axis, off-normal incidence reflection geometry. Compared to transmission optical elements, the signal-to-background ratio is significantly increased by separating the first from other diffraction orders without drastically reducing the size of the smallest diffractive element. The reflection photon sieve produces sharp foci at maximum contrast and offers the advantages of effective heat dissipation and a large working space above the focal plane. Experimental results for a device working at a photon energy of
© 2011 Optical Society of America
OCIS Codes
(230.1950) Optical devices : Diffraction gratings
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
ToC Category:
Optical Devices
History
Original Manuscript: March 8, 2011
Revised Manuscript: May 13, 2011
Manuscript Accepted: May 30, 2011
Published: June 20, 2011
Citation
Matthias Kalläne, Jens Buck, Sönke Harm, Ralph Seemann, Kai Rossnagel, and Lutz Kipp, "Focusing light with a reflection photon sieve," Opt. Lett. 36, 2405-2407 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-13-2405
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