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Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology

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Abstract

Using a 7.5μm diameter disk fabricated with III-V-on-silicon fabrication technology, we demonstrate bias-free all-optical wavelength conversion for non-return-to-zero on–off keyed pseudorandom bit sequence (PRBS) data at the speed of 10Gbits/s with an extinction ratio of more than 12dB. The working principle of such a wavelength converter is based on free-carrier-induced refractive index modulation in a pump–probe configuration. We believe it to be the first bias-free on-chip demonstration of all-optical wavelength conversion using PRBS data. All-optical gating measurements in the pump–probe configuration with the same device have revealed that it is possible to achieve wavelength conversion beyond 20Gbits/s.

© 2011 Optical Society of America

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