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Phase noise measurement of a narrow linewidth CW laser using delay line approaches |
Optics Letters, Vol. 36, Issue 14, pp. 2713-2715 (2011)
http://dx.doi.org/10.1364/OL.36.002713
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Abstract
Two different laser phase noise measurement techniques are compared. One of these two techniques is based on a conventional and low-cost delay line system, which is usually set up for the linewidth measurement of semiconductor lasers. The results obtained with both techniques on a high-spectral-purity laser agree well and confirm the interest of the low-cost technique. Moreover, an extraction of the laser linewidth using computer-aided design tools is performed.
© 2011 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2920) Instrumentation, measurement, and metrology : Homodyning
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(290.3700) Scattering : Linewidth
(060.3510) Fiber optics and optical communications : Lasers, fiber
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: March 16, 2011
Revised Manuscript: May 23, 2011
Manuscript Accepted: June 9, 2011
Published: July 14, 2011
Citation
O. Llopis, P. H. Merrer, H. Brahimi, K. Saleh, and P. Lacroix, "Phase noise measurement of a narrow linewidth CW laser using delay line approaches," Opt. Lett. 36, 2713-2715 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-14-2713
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