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Fast localized wavefront correction using area-mapped phase-shift interferometry |
Optics Letters, Vol. 36, Issue 15, pp. 2892-2894 (2011)
http://dx.doi.org/10.1364/OL.36.002892
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Abstract
We propose an innovative method for localized wavefront correction based on area-mapped phase-shift (AMPS) interferometry. In this Letter, we present the theory and then experimentally compare it with a previously demonstrated method based on spot-optimized phase-stepping (SOPS) interferometry. We found that AMPS outperforms SOPS interferometry in terms of speed by threefold, although in noisy environments the improvements may be larger. AMPS yielded similar point-spread functions (PSF) as SOPS for moderate system-induced aberrations, but yielded a slightly less ideal PSF for larger aberrations. The method described in this Letter may prove crucial for applications where the phase-stepping solution does not have sufficient speed.
© 2011 Optical Society of America
OCIS Codes
(090.1000) Holography : Aberration compensation
(230.6120) Optical devices : Spatial light modulators
(110.0113) Imaging systems : Imaging through turbid media
(110.2650) Imaging systems : Fringe analysis
(070.6120) Fourier optics and signal processing : Spatial light modulators
(110.1080) Imaging systems : Active or adaptive optics
ToC Category:
Optical Design and Fabrication
History
Original Manuscript: May 16, 2011
Manuscript Accepted: June 22, 2011
Published: July 27, 2011
Virtual Issues
Vol. 6, Iss. 9 Virtual Journal for Biomedical Optics
Citation
Gunnsteinn Hall, Gabriel C. Spalding, Paul J. Campagnola, John G. White, and Kevin W. Eliceiri, "Fast localized wavefront correction using area-mapped phase-shift interferometry," Opt. Lett. 36, 2892-2894 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-15-2892
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